Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods By Leng, Yang Published by WILEY Publication Date: 2013-09-11 Subject: Technology & Engineering Materials Science General, Technology & Engineering Materials Science - General, Materials Science, Mechanical Engineering & Materials, Werkstoffprüfung, Hc Chemie, Hardcover, Softcover Chemie, Mechanical Engineering, Technology & Engineering Materials Science General, Technology & Engineering, Materials Science, General, Mechanical Engineering & Materials, Hc Chemie, Hc, Chemie, Materials Characterization, Analysis Characterization Of Nanosystems, Analysis, Characterization Of Nanosystems, Solid State Chemistry, Microscopy, Spectroscopy, Microstructure Analysis, X-Ray Diffraction, Transmission, Scanning Electron Microscopy, Scanning Probe Microscopy, Chemical Analysis, Photoelectron, Secondary Ion Mass Spectroscopy, Microscopes & Microscopy, Spectroscopy & Spectrum Analysis Subject Keywords: Analyse u. Charakterisierung von Nanosystemen; Analysis/Characterization of Nanosystems; Chemie; Chemistry; Festkörperchemie; Festkörperphysik; Materials Characterization; Materials Science; Materialwissenschaften; Nanotechnologie; Nanotechnology; Physics; Physik; Solid State Chemistry; Solid State Physics; Werkstoffprüfung, microscopy, spectroscopy, microstructure analysis, X-ray diffraction, transmission, scanning electron microscopy, scanning probe microscopy, chemical analysis, photoelectron, secondary ion mass spectroscopy, microscopy; spectroscopy; microstructure analysis; X-ray diffraction; transmission; scanning electron microscopy; scanning probe microscopy; chemical analysis; photoelectron; secondary ion mass spectroscopy Genre: Technology & Engineering, Materials Science, General, Mechanical Engineering & Materials, Hc, Chemie Target Audience: Professional and scholarly