ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis (Paperback)
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артикул: COM9781627081504NEW
СОГЛАСНО НАШИМ ДАННЫМ, ЭТОТ ПРОДУКТ СЕЙЧАС НЕ ДОСТУПЕН
$188.88
Доставка из: Канада
Описание
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
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