ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis (Paperback)

ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis (Paperback)
sku: COM9781627081504NEW
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   Description
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
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