An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
sku: 55707383
2,057.89 руб.
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abonement: false
age: 0
author: Sarah Fearn
genres_list: 5668,5670,5671
ISBN: 9781681740881
lang: en
publisher: Ingram
series: IOP Concise Physics
Type: book
Форматы: PDF
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